Source 1 X-ray has innovative and the lowest cost sources for the following applications: Bone density measurement, circuit board inspection, radiography, process control, thickness gauging, plating gauging, fill level monitoring, multilayer board inspection, microfocus x-ray, through hole inspection, particle size measurement, bond attachment verification, casting inspection, security systems, food inspection, wood and board density measuring.

Over the years we have made O.E.M. sources that were either designed for or adapted to such customers as : Industrial Dynamics, Filtec, Glenbrook Technologies, RTX-113, RTX mini, Multiline, Nicolet, Osteometer, Rapiscan, and Novus x-ray systems. Our unique sources have replaced those of Kevex X-ray, Trufocus and Oxford.